IDT71256 View Datasheet(PDF) - Integrated Device Technology
Part Name
Description
Manufacturer
IDT71256
Integrated Device Technology
IDT71256 Datasheet PDF : 9 Pages
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IDT71256 S/L
CMOS STATIC RAM 256K (32K x 8-BIT)
PIN CONFIGURATIONS
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O 0
I/O 1
I/O 2
GND
1
28
2
27
3
26
4
25
5
24
6 D28-3 23
7 P28-1 22
P28-2
8 D28-1 21
9 SO28-5 20
10
19
11
18
12
17
13
16
14
15
V CC
WE
A13
A8
A9
A11
OE
A10
CS
I/O 7
I/O 6
I/O 5
I/O 4
I/O 3
2946 drw 02
DIP/SOJ
TOP VIEW
INDEX
A6
A5
A4
A3
A2
A1
A0
NC
I/O0
4 3 2 32 31 30
5
1
29
6
28
7
27
8
L32-1
26
9
25
10
24
11
23
12
22
13
21
14 15 16 17 18 19 20
A8
A9
A11
NC
OE
A10
CS
I/O7
I/O 6
2946 drw 03
32-Pin LCC
TOP VIEW
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TRUTH TABLE(1)
WE
CS OE
I/O
X
H
X
High-Z
X
VHC
X
High-Z
H
L
H
High-Z
H
L
L
DOUT
L
L
X
DIN
NOTE:
1. H = VIH, L = VIL, X = Don’t Care
Function
Standby (ISB)
Standby (ISB1)
Output Disabled
Read Data
Write Data
2946 tbl 02
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
Com’l.
Mil.
Unit
VTERM Terminal Voltage –0.5 to +7.0 –0.5 to +7.0 V
with Respect
to GND
TA
Operating
0 to +70 –55 to +125 °C
Temperature
TBIAS
Temperature
Under Bias
–55 to +125 –65 to +135 °C
TSTG
Storage
Temperature
–55 to +125 –65 to +150 °C
PT
Power Dissipation 1.0
1.0
W
IOUT
DC Output
Current
50
50
mA
NOTE:
2946 tbl 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating con-
ditions for extended periods may affect reliability.
PIN DESCRIPTIONS
Name
Description
A0–A14
Addresses
I/O0–I/O7
CS
WE
OE
Data Input/Output
Chip Select
Write Enable
Output Enable
GND
Ground
VCC
Power
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol
Parameter(1)
Conditions Max. Unit
CIN
Input Capacitance
VIN = 0V
11 pF
CI/O
I/O Capacitance
VOUT = 0V 11 pF
NOTE:
2946 tbl 04
1. This parameter is determined by device characterization, but is not
production tested.
2946 tbl 01
7.2
2
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