ISPGDX160V-9Q208I View Datasheet(PDF) - Lattice Semiconductor

Part Name

Description

Manufacturer

ISPGDX160V-9Q208I

In-System Programmable 3.3V Generic Digital Crosspoint

Lattice Semiconductor 

Specifications ispGDX160VA

Switching Test Conditions

Figure 8. Test Load

Input Pulse Levels

GND to VCCIO(MIN)

Input Rise and Fall Time

< 1.5ns 10% to 90%

VCCIO

Input Timing Reference Levels

VCCIO(MIN)/2

Output Timing Reference Levels

VCCIO(MIN)/2

Output Load

See Figure 8

S 3-state levels are measured 0.5V from steady-state active level.

E Output Load Conditions (See Figure 8)

IC D TEST CONDITION

A

V Active High

E B

Active Low

Active High to Z

E U C at VOH-0.5V

Active Low to Z

at VOL+0.5V

D IN D SlowSlew

3.3V

2.5V

R1 R2 R1 R2 CL

153Ω

∞

153Ω

134Ω

134Ω

∞

156Ω

∞

156Ω

144Ω

144Ω

∞

35pF

35pF

35pF

∞ 134Ω ∞ 144Ω 5pF

153Ω ∞ 156Ω ∞ 5pF

∞ ∞ ∞ ∞ 35pF

Table 2-0004A/gdx160va

Device

Output

R1

Test

Point

R2

CL*

*CL includes Test Fixture and Probe Capacitance.

0213D

T T DC Electrical Characteristics for 3.3V Range1

Over Recommended Operating Conditions

C N SYMBOL

PARAMETER

VCCIO I/O Reference Voltage

E VIL

Input Low Voltage

O VIH

Input High Voltage

L VOL

Output Low Voltage

E C VOH

Output High Voltage

S DIS 1. I/O voltage configuration must be set to VCC.

CONDITION

–

VOH ≤ VOUT or VOUT ≤ VOL (MAX)

VOH ≤ VOUT or VOUT ≤ VOL(MAX)

VCC = VCC (MIN)

VCC = VCC (MIN)

IOL = +100µA

IOL = +24mA

IOH = -100µA

IOH = -12mA

MIN.

3.0

-0.3

2.0

–

–

2.8

2.4

TYP.

–

–

–

–

–

–

–

MAX. UNITS

3.6

V

0.8

V

5.25 V

0.2

V

0.55 V

–

V

–

V

Table 2-0007/gdx160va

9

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