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LH28F008SCL-12 View Datasheet(PDF) - Sharp Electronics

Part Name
Description
Manufacturer
LH28F008SCL-12
Sharp
Sharp Electronics Sharp
LH28F008SCL-12 Datasheet PDF : 49 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
SHARP
LHF08CH3
7
2 PRINCIPLES OF OPERATION
The LH28F008SCT-L12 SmartVoltage Flash memory
includes an on-chip WSM to manage block erase,
byte write, and lock-bit configuration functions. It
allows for: 100% TTL-level control inputs, fixed power
supplies during block erasure, byte write, and lock-bit
configuration, and minimal processor overhead with
RAM-Like interface timings.
After initial device power-up or return from deep
power-down mode (see Bus Operations), the device
defaults to read array mode. Manipulation of external
memory control pins allow array read, standby, and
output disable operations.
Status register and identifier codes can be accessed
through the CUI independent of the V,, voltage. High
voltage on V,, enables successful block erasure,
byte writing, and lock-bit configuration. All functions
associated with altering memory contents-block
erase, byte write, Lock-bit configuration, status, and
identifier codes-are accessed via the CUI and
verified through the status register.
Commands
are written
using standard
microprocessor write timings. The CUI contents serve
as input to the WSM, which controls the block erase,
byte write, and lock-bit configuration. The internal
algorithms are regulated by the WSM, including pulse
repetition, internal verification, and margining of data.
Addresses and data are internally latch during write
cycles. Writing the appropriate command outputs
array data, accesses the identifier codes, or outputs
status register data.
Interface software that initiates and polls progress of
block erase, byte write, and lock-bit configuration can
be stored in any block. This code is copied to and
executed from system RAM during flash memory
updates. After successful completion, reads are
again possible via the Read Array command. Block
erase suspend allows system software to suspend a
block erase to read or write data from any other
block. Byte write suspend allows system software to
suspend a byte write to read data from any other
flash memory array location.
FFFFF
FOOOO
EFFFF
EOOW
DFFFF
DO000
CFFFF
coooo
BFFFF
BOO00
AFFFF
AOOW
SFFFF
90000
8FFFF
80000
7FFFF
70000
6FFFF
60000
SFFFF
50000
4FFFF
40000
JFFFF
30000
PFFFF
20000
1 FFFF
10000
OFFFF
FigUre 3. Memory
Map
2: 1 Data Protection
Depending on the application, the system designer
may choose to make the V,, power supply
switchable (available only when memory block
erases, byte writes, or lock-bit configurations are
required) or hardwired to V,,,,,z13. The device
accommodates
either design practice and
encourages optimization of the processor-memory
interface.
When Vpp~VppLK, memory contents cannot be
altered. The CUI, with two-step block erase, byte
write, or lock-bit configuration command sequences,
provides protection from unwanted operations even
when high voltage is applied to V,,. All write
functions are disabled when Vcc is below the write
lockout voltage VLKO or when RP# is at V,,. The
device’s block locking capability provides additional
protection from inadvertent code or data alteration by
gating erase and byte write operations.
Rev.1.3

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