ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics
Characteristics noted under conditions -40°C ≤ TJ ≤ 125°C unless otherwise noted. Input voltages VIN1 = VIN2 = 3.3 V using
the typical application circuit (see Figure 27) unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
BUCK CONVERTER (SW, SR)
Duty Cycle Range (Normal Operation) (22)
D
10
–
90
%
Switching Node SW Rise Time (22)
ILOAD = 10 A, SR = OPEN, VIN1 = VIN2 = 3.3 V
tROPEN
ns
–
10
–
Switching Node SW Fall Time (22)
ILOAD = 10 A, SR = OPEN, VIN1 = VIN2 = 3.3 V
tFOPEN
ns
–
10
–
Switching Node SW Rise Time (22)
ILOAD = 10 A, SR = SW, VIN1 = VIN2 = 3.3 V
tRSW
ns
–
14
–
Switching Node SW Fall Time (22)
ILOAD = 10 A, SR = SW, VIN1 = VIN2 = 3.3 V
tFSW
ns
–
14
–
Switching Node SW Rise Time (22)
ILOAD = 10 A, SR = BOOT,VIN1 = VIN2 = 3.3 V
tRBOOT
ns
–
6.0
–
Switching Node SW Fall Time (22)
ILOAD = 10 A, SR = BOOT, VIN1 = VIN2 = 3.3 V
tFBOOT
ns
–
6.0
–
Maximum Deadtime (22)
tD
–
150
–
ns
Buck Control Loop Propagation Delay (22)
tPD
ns
VINV < 0.8 V to VSW > 90% of High Level or VINV > 0.8 V to VSW < 10%
of Low Level
–
50
–
Soft Start Duration (Power Sequencing Disabled, EN1 = 1, EN2 = 1) (22)
tSS
800
µs
Fault Condition Timeout (22)
tFAULT
–
10
–
ms
Retry Timer Cycle (22)
tRET
–
100
–
ms
OSCILLATOR (FREQ)
Oscillator Default Frequency (Switching Frequency), FREQ Pin Open
fOSC
250
300
350
kHz
Oscillator Frequency Range
fOSC
200
400
kHz
Oscillator Output Signal Duty Cycle (Square Wave, 180° Out-of-Phase with
DOSC
%
the Internal Suitable Oscillator) (23)
–
50
–
Synchronization Pulse Minimum Duration (22)
tSYNC
300
–
–
ns
BOOST REGULATOR (VBST, VBST (sense), VBD)
Boost Regulator FET Maximum ON Time (23)
Boost Regulator Control Loop Propagation Delay (22)
Boost Switching Node VBD Rise Time (22)
IBST = 45 mA
Boost Switching Node VBD Fall Time (22)
IBST = 45 mA
tON
–
24
–
µs
tBSTPD
–
50
–
ns
tBR
ns
–
35
–
tBF
ns
–
5.0
–
Notes
22. Design Information only. Not production tested.
23. Not production tested for typical values specified.
Analog Integrated Circuit Device Data
Freescale Semiconductor
34703
11