OKI Semiconductor
FEDL674000-02
ML674000
Analog-to-Digital Converter Characteristics
(VDD_CORE = 2.50 V, VDD_IO = 3.3 V, Ta = 25°C)
Item
Symbol
Conditions
Minimum Typical Maximum Unit
Resolution
n
—
—
—
10
bit
Linearity error
EL
—
±3
—
Analog input source
Differential linearity error
ED
impedance
—
±3
—
LSB
Zero scale error
EZS
Ri ≤ 1kΩ
—
±3
—
Full scale error
EFS
—
±3
—
Conversion time
tCONV
—
5
—
—
µs
Throughput
—
10
Note: VDD_IO and AVDD should be supplied separately.
—
200
kHz
• Definition of Terms
(1) Resolution: Minimum input analog value recognized. For 10-bit resolution, this is (VREF –
Aground) ÷ 1024.
(2) Linearity error: Difference between the theoretical and actual conversion characteristics.
(Note that it does not include quantization error.) The theoretical conversion characteristic
divides the voltage range between VREF and AGND into 1024 equal steps.
(3) Differential linearity error: Difference between the theoretical and actual input voltage change
producing a 1-bit change in the digital output anywhere within the conversion range. This is an
indicator of conversion characteristic smoothness. The theoretical value is (VREF – Aground)
÷ 1024.
(4) Zero scale error: Difference between the theoretical and actual conversion characteristics at
the point where the digital output switches from “0x000” to “0x001.”
(5) Full scale error: Difference between the theoretical and actual conversion characteristics at the
point where the digital output switches from “0x3FE” to “0x3FF.”
20/24