DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

HYB39S64800ATL View Datasheet(PDF) - Infineon Technologies

Part Name
Description
Manufacturer
HYB39S64800ATL
Infineon
Infineon Technologies Infineon
HYB39S64800ATL Datasheet PDF : 53 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
64 MBit Synchronous DRAM
HYB39S64400/800/160AT(L)
64MBit Synchronous DRAM
High Performance:
-8 -8B -10 Units
fCKmax. 125 100 100 MHz
tCK3
8
10
10
ns
tAC3
6
6
7
ns
tCK2
10
12
15
ns
tAC2
6
7
8
ns
Fully Synchronous to Positive Clock Edge
0 to 70 °C operating temperature
Four Banks controlled by BA0 & BA1
Programmable CAS Latency: 2 & 3
Programmable Wrap Sequence: Sequential
or Interleave
Programmable Burst Length: 1, 2, 4, 8
full page (optional) for sequential wrap
around
Multiple Burst Read with Single Write
Operation
Automatic and Controlled Precharge
Command
Data Mask for Read / Write control (x4, x8)
Data Mask for byte control (x16)
Auto Refresh (CBR) and Self Refresh
Suspend Mode and Power Down Mode
4096 refresh cycles / 64 ms
Random Column Address every CLK
( 1-N Rule)
Single 3.3V +/- 0.3V Power Supply
LVTTL Interface version
Plastic Packages:
P-TSOPII-54 400mil width (x4, x8, x16)
-8 version for PC100 2-2-2 applications
-8B version for PC100 3-2-3 applications
The HYB39S64400/800/160AT are four bank Synchronous DRAM’s organized as 4 banks x 4MBit
x4, 4 banks x 2MBit x8 and 4 banks x 1Mbit x16 respectively. These synchronous devices achieve
high speed data transfer rates by employing a chip architecture that prefetches multiple bits and
then synchronizes the output data to a system clock. The chip is fabricated with SIEMENS’
advanced quarter micron 64MBit DRAM process technology.
The device is designed to comply with all JEDEC standards set for synchronous DRAM products,
both electrically and mechanically. All of the control, address, data input and output circuits are
synchronized with the positive edge of an externally supplied clock.
Operating the four memory banks in an interleave fashion allows random access operation to occur
at higher rate than is possible with standard DRAMs. A sequential and gapless data rate is possible
depending on burst length, CAS latency and speed grade of the device.
Auto Refresh (CBR) and Self Refresh operation are supported. These devices operates with a
single 3.3V +/- 0.3V power supply and are available in TSOPII packages.
The -8 version of this product is best suited for use on a 100 Mhz bus for both CAS latencies 2 & 3.
Semiconductor Group
1
10.98

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]