NLSX5014 View Datasheet(PDF) - ON Semiconductor
Part Name
Description
Manufacturer
NLSX5014 Datasheet PDF : 14 Pages
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NLSX5014
MAXIMUM RATINGS
Symbol
Parameter
Value
Condition
Unit
VCC
High−side DC Supply Voltage
−0.5 to +5.5
V
VL
Low−side DC Supply Voltage
−0.5 to +5.5
V
I/O VCC VCC−Referenced DC Input/Output Voltage
−0.5 to +5.5
V
I/O VL VL−Referenced DC Input/Output Voltage
−0.5 to +5.5
V
VI
Enable Control Pin DC Input Voltage
−0.5 to +5.5
V
IIK
DC Input Diode Current
−50
VI < GND
mA
IOK
DC Output Diode Current
−50
VO < GND
mA
ICC
DC Supply Current Through VCC
$100
mA
IL
DC Supply Current Through VL
$100
mA
IGND
DC Ground Current Through Ground Pin
$100
mA
TSTG
Storage Temperature
−65 to +150
°C
ESD Rating
Machine Model
400
V
Human Body Model
7000
V
Charged Device Model
2000
V
LU Pass
100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
High−side Positive DC Supply Voltage
VL
Low−side Positive DC Supply Voltage
VI
Enable Control Pin Voltage
VIO
Bus Input/Output Voltage
I/O VCC
I/O VL
0.9
0.9
GND
GND
GND
4.5
V
4.5
V
4.5
V
4.5
V
4.5
TA
Operating Temperature Range
−55
+125
°C
Dt/DV
Input Transition Rise or Rate
VI, VIO from 30% to 70% of VCC; VCC = 3.3 V $ 0.3 V
0
10
ns
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the
Recommended Operating Ranges limits may affect device reliability.
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