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TDA8785H View Datasheet(PDF) - Philips Electronics

Part Name
Description
Manufacturer
TDA8785H Datasheet PDF : 24 Pages
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Philips Semiconductors
8-bit high-speed analog-to-digital converter
with gain and offset controls
Product specification
TDA8785
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP. MAX. UNIT
Timing
ADC DIGITAL OUTPUTS (CL = 15 pF)
tds
sampling delay time
th
output hold time
td
output delay time
1.5
ns
7
ns
16 ns
DAC OUTPUTS (PINS VDACO(p) AND VDACO(n))
tSU; DAT data set-up time
note 4
0.3
tHD; DAT data hold time
note 4
tS
DAC setting time (10 to 90%)
RL = 150 ; CL = 15 pF
8
RSA
residual setting accuracy
note 5; see Fig.8
0.1
ns
2
ns
ns
2.5 %
3-STATE OUTPUT DELAY TIMES (see Fig.5)
tdZH
enable HIGH
tdZL
enable LOW
tdHZ
disable HIGH
tdLZ
disable LOW
15
20 ns
15
20 ns
13
20 ns
10
20 ns
Notes
1. Vos is proportional to the amplifier gain. For instance, Vos at 20 dB is the one indicated at 0 dB multiplied by 10.
2. It is recommended that the rise and fall times of the clock are >1 ns. In addition a good layout for the digital and
analog grounds is recommended.
3. Analog processing from signal inputs or fast offset amplifier inputs to ADC digital output; fclk = 30 MHz; no external
filtering on pin 6 (B).
4. The data set-up time (tSU; DAT) is the minimum period preceding the rising edge of the clock, that the input data must
be stable in order to be correctly registered. A negative set-up time indicates that the data may be initiated after the
rising edge and still be recognized. The data set hold time (tHD; DAT) is the minimum period following the rising edge
of the clock, that the input data must be stable in order to be correctly registered. A negative hold time indicates that
the data may be released prior to the rising edge and still be recognized.
5. The residual settling accuracy is defined as follows. When a full-scale step is applied to the DAC, the initial settling
shows a fast settling behaviour. For the final part, the DAC analog output shows a slow settling behaviour.
The Residual Settling Accuracy (RSA) is defined as the full-scale error at the cross-over point at time tX.
1997 Dec 18
11

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