RT7251A/B
Parameter
Symbol
Test Conditions
Min Typ Max Unit
Minimum On-Time
Input Under Voltage Lockout
Threshold
Input Under Voltage Lockout
Threshold Hysteresis
tON
VUVLO
ΔVUVLO
EN Threshold
Voltage
Logic-High VIH
Logic-Low VIL
EN Pull Low Current
Soft-Start Period
tSS
Thermal Shutdown
TSD
Thermal Shutdown Hysteresis ΔTSD
Power Good Threshold Rising
Power Good Threshold
Hysteresis
Power Good Pull Down
Resistance
Output OVP Threshold
Output OVP Propagation
Delay
VEN = 2V, VFB = 1V
--
100
--
ns
--
3.5
--
V
--
200
--
mV
2.5
--
--
V
--
--
0.4
--
1
--
μA
--
1
--
ms
--
150
--
°C
--
15
--
°C
--
0.7
--
V
--
130
--
mV
--
12
--
Ω
--
125
-- %VREF
--
10
--
μs
Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in
the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may
affect device reliability.
Note 2. θJA is measured at TA = 25°C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. θJC is
measured at the exposed pad of the package.
Note 3. Devices are ESD sensitive. Handling precaution is recommended.
Note 4. The device is not guaranteed to function outside its operating conditions.
Copyright ©2012 Richtek Technology Corporation. All rights reserved.
DS7251A/B-01 April 2012
is a registered trademark of Richtek Technology Corporation.
www.richtek.com
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