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S-8261AAJMD View Datasheet(PDF) - Seiko Instruments Inc

Part Name
Description
Manufacturer
S-8261AAJMD
SII
Seiko Instruments Inc SII
S-8261AAJMD Datasheet PDF : 36 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.1.9_00
Table 13
S-8261ABH
Parameter
Symbol
Test
condition
Remark
Min.
Typ. Max.
Unit
Test
circuit
[DELAY TIME] 25°C
Overcharge detection delay time
tCU
9
0.24 0.3 0.36 s
5
Overdischarge detection delay time tDL
9
29 36 43 ms 5
Overcurrent 1 detection delay time tlOV1
10
14 18 22 ms 5
Overcurrent 2 detection delay time tlOV2
10
Load short-circuiting detection delay
time
tSHORT
10
1.8 2.24 2.7 ms 5
220 320 380 µs 5
[DELAY TIME] 40°C to +85°C*1
Overcharge detection delay time
tCU
9
0.17 0.3 0.51 s
5
Overdischarge detection delay time tDL
9
20 36 61 ms 5
Overcurrent 1 detection delay time tlOV1
10
10 18 31 ms 5
Overcurrent 2 detection delay time tlOV2
10
1.2 2.24 3.8 ms 5
Load short-circuiting detection delay
time
tSHORT
10
150 320 540 µs 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
14
Seiko Instruments Inc.

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