SI3000-C-GS View Datasheet(PDF) - Silicon Laboratories

Part Name

Description

Manufacturer

SI3000-C-GS

VOICEBAND CODEC WITH MICROPHONE/SPEAKER DRIVE

Silicon Laboratories 

Si3000

Table 4. AC Characteristics (Continued)

(VA, VD = 5 V ±5% or 3.3 V ±10%, TA = 0 to 70°C)

Parameter

DAC Output Gain Step Size

DAC Freq Response5

DAC Freq Response5

DAC Freq Response

DAC Line Output Load Resistance

DAC Line Output Load Capacitance

DAC SPKR Output Load Resistance

DAC Gain Drift

Interchannel Isolation (Crosstalk)

HDST Full Scale Level Input

HDST Full Scale Level Output6

HDST Output Resistance

MIC Bias Voltage

MIC Power Supply Rejection Ratio

Symbol

FRR

FRR

FRR

AT

Rout

Vmbias

PSRR

Test Condition

Low –3 dB corner

300 Hz

3400 Hz

VIN = 1 kHz

DC

Min

—

—

–0.01

–0.2

600

—

—

—

—

—

—

—

—

—

Typ

1.5

33

—

—

—

—

60

0.002

90

0.5

1.0

600

2.5

40

Max

—

—

0

0

—

40

—

—

—

—

—

—

—

—

Unit

dB

Hz

dB

dB



pF



dB/°C

dB

Vrms

Vrms



V

dB

Notes:

1. DR = VIN + 20 log (RMS signal/RMS noise). Measurement bandwidth is 300 to 3400 Hz. Valid sample rate ranges

between 4000 and 12000 Hz.

2. 0 dB setting for analog and digital attenuation/gain.

3. THD = 20 log (RMS distortion/RMS signal). Valid sample rate ranges between 4000 and 12000 Hz.

4. At 0 dB gain setting, 1 Vrms input corresponds to –1.5 dB of full scale digital output code.

5. These characteristics are determined by external components. See Figure 13.

6. With a 600  load. Output starts clipping with half of full scale digital input, which corresponds to a 0.5 Vrms output.

Table 5. Absolute Maximum Ratings

Parameter

Symbol

Value

Unit

DC Supply Voltage

VD, VA

–0.5 to 6.0

V

Input Current, Si3000 Digital Input Pins

IIN

±10

mA

Digital Input Voltage

VIND

–0.3 to (VD + 0.3)

V

Operating Temperature Range

TA

–10 to 100

°C

Storage Temperature Range

TSTG

–40 to 150

°C

Note: Permanent device damage may occur if the above Absolute Maximum Ratings are exceeded. Functional operation

should be restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

6

Rev. 1.4

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