Si3210/Si3211
Table 5. Monitor ADC Characteristics
(VDDA, VDDD = 3.13 to 5.25 V, TA = 0 to 70 °C for F-Grade, –40 to 85 °C for G-Grade)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Differential Nonlinearity
(6-bit resolution)
Integral Nonlinearity
(6-bit resolution)
Gain Error (Voltage)
DNLE
INLE
–1/2
—
–1
—
—
—
1/2
LSB
1
LSB
10
%
Gain Error (Current)
—
—
20
%
Table 6. Si321x DC Characteristics, VDDA = VDDD = 5.0 V
(VDDA,VDDD = 4.75 to 5.25 V, TA = 0 to 70 °C for F-Grade, –40 to 85 °C for G-Grade)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
High Level Input Voltage
VIH
0.7 x VDDD —
—
V
Low Level Input Voltage
VIL
—
— 0.3 x VDDD V
High Level Output Voltage
VOH
DIO1,DIO2,SDITHRU:
IO = –4 mA SDO,
DTX:IO = –8 mA
VDDD – 0.6 —
—
V
DOUT: IO = –40 mA
VDDD – 0.8 —
—
V
Low Level Output Voltage
DIO1,DIO2,DOUT,SDITHRU:
VOL
IO = 4 mA
—
SDO,INT,DTX:IO = 8 mA
—
0.4
V
Input Leakage Current
IL
–10
—
10
µA
Table 7. Si321x DC Characteristics, VDDA = VDDD = 3.3 V
(VDDA,VDDD = 3.13 to 3.47 V, TA = 0 to 70 °C for F-Grade, –40 to 85 °C for G-Grade)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
Low Level Output Voltage
Input Leakage Current
VIH
VIL
VOH
VOL
IL
0.7 x VDDD —
—
V
—
— 0.3 x VDDD V
DIO1,DIO2,SDITHRU: IO =–2 mA
SDO, DTX:IO = –4 mA
VDDD – 0.6
—
—
V
DOUT: IO = –40 mA
VDDD – 0.8 —
—
V
DIO1,DIO2,DOUT,SDITHRU:
IO = 2 mA
—
—
0.4
V
SDO,INT,DTX:IO = 4 mA
–10
—
10
µA
Rev. 1.61
11