SPT5230 View Datasheet(PDF) - Fairchild Semiconductor
Part Name
Description
Manufacturer
SPT5230 Datasheet PDF : 7 Pages
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ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1
Supply Voltages
Output Current
AVDD (measured to AVSS) ........................... –0.3 to 7.0 V
IOUT ........................................................................... 0 to 14 mA
Input Voltage
Clock and Data ......................................... AVSS to AVDD
Temperature
Operating, ambient ........................................ 0 to +70 °C
Storage ................................................... –55 to + 125 °C
Note: 1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal applied
conditions in typical applications.
ELECTRICAL SPECIFICATIONS
fCLK = 27 MWPS, AVDD = 5.0 V, Output Pull-Up Load = 75 Ω, TA = 25 °C, AVSS = 0.0 V
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
MIN
DC Performance
Resolution
Differential Linearity
Integral Linearity
TA = TMIN to TMAX
I
–1.0
I
–2.5
Analog Outputs
Output Voltage Range
Conversion Rate
Output Offset Voltage
Signal-to-Noise Ratio
Settling Time1
Propagation Delay (tpd)
Crosstalk
FS Control Voltage (VCS2)
VCS2 = +2.1 V
I
3.0
I
27
I
I
46
I
V
I
–49
V
2.0
Digital Inputs and Timing
Input Current, Logic High
Logic Low
Set-Up Time, Data and Controls (tS)
Hold Time, Data and Controls (th)
Clock Duty Cycle
VIH = 5 V
VIL = 0 V
I
I
–5
I
5
I
10
V
40
Power Supply Requirements
Supply Voltage
Supply Current
Power Dissipation
1 Vp-p Output
2 Vp-p Output
1 Vp-p Output
2 Vp-p Output
I
4.75
IV
I
IV
I
1Full-scale settling time to within ±2% of full scale.
TYP
MAX UNITS
10.0
Bits
1.0 LSB
2.0 LSB
5.0 V
36
MWPS
2.4
14 mV
52
dB
16
23 ns
10
12 ns
–54
dB
4.0 V
5 µA
µA
ns
ns
60 %
5.25 V
56 mA
100 mA
280 mW
485
500 mW
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA=25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
SPT5230
2
5/1/00
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