CXD1807Q View Datasheet(PDF) - Sony Semiconductor
Part Name
Description
Manufacturer
CXD1807Q Datasheet PDF : 18 Pages
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CXD1807Q
Item
RAS pulse width
Read/write cycle
RAS-CAS delay time
CAS pulse width
CAS-WE delay time
WE pulse width
OE hold time (for WE ↓)
CAS-OE delay time
Row address setup time (for RAS ↓)
Row address hold time (for RAS ↓)
Column address setup time (for CAS ↓)
Column address hold time (for CAS ↓)
Data input setup time (for OE ↑)
Data input hold time (for OE ↑)
Data output setup time (for WE ↓)
Data output hold time (for WE ↓)
(Tw = 1/f, f: master clock frequency)
Symbol Min.
Typ.
Tras
7Tw
Trwc
9Tw
Trcd
2Tw
Tcas
5Tw
Tcwd
4Tw
Twp
Tw
Toeh
Tw
Tcod
2Tw
Tasr 2Tw – 45
Trah
Tw – 15
Tasc Tw – 35
Tcah
5Tw
Tdsi
35
Tdhi
0
Tds
Tw – 50
Tdh
Tw – 15
Max. Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
3. Built-in DAC Characteristics
Recommended operating conditions
Item
Symbol
Supply voltage
AVDD1, AVDD2, AVDD3
Reference input voltage VRF
Ratings Unit
4.5 to 5.5 V
0.5 to 2.0 V
Electrical characteristics
(VDD = 5V, VRF = 2V, R = 200Ω, Ta = 25°C)
Item
Symbol Conditions Min.
Typ. Max. Unit
Resolution
n
4
bit
Differential linearity error
ED
–0.5
+0.5 LSB
Integral linearity error
EL
–1.0
+1.0 LSB
Full-scale output voltage
VFS
1.9
2.0
2.1
V
Full-scale output current
IFS
10
15 mA
Assured precision output voltage range VOC
0.5
2.0
2.1
V
– 10 –
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