TB2922HQ View Datasheet(PDF) - Toshiba

Part Name

Description

Manufacturer

TB2922HQ

TOSHIBA Bi-CMOS Digital Integrated Circuit Silicon Monolithic

Toshiba 

Test Circuit

TB2922HQ

0.22 μF

IN1

4

C1

0.22 μF

IN2

2

C1

1000μF 0.1μF

7

VCC2

OUT1 (+)

8

RL

OUT1 (−)

9

OUT2 (+)

12

RL

OUT2 (−)

11

PRE-GND

3

RIP STBY PW-GND MUTE

5

1

10

6

10μF R2

1 kΩ

R1 47 kΩ

1μF

5V

PLAY

MUTE

: PRE-GND

: PW-GND

Components in the test circuits are only used to obtain and confirm the device characteristics.

These components and circuits do not warrant to prevent the application equipment from malfunction or failure.

7

2007-02-20

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