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UPD17217CT-XXX View Datasheet(PDF) - NEC => Renesas Technology

Part Name
Description
Manufacturer
UPD17217CT-XXX Datasheet PDF : 84 Pages
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µPD17215, 17216, 17217, 17218
1.3 Processing of Unused Pins
Process the unused pins as follows:
Table 1-1 Processing of Unused Pins
Pin
P0A0-P0A3
P0B0-P0B3
P0C0-P0C3
P0D0-P0D3
P0E0-P0E3
REM
INT
WDOUT
Recommended Connection
Connect to VDD
Connect to VDD
Connect to GND
Connect to GND
Input : Connect to VDD or GND
Output : Open
Open
Connect to GND
Connect to GND
1.4 Notes on Using INT and RESET Pins
In addition to the functions shown in 1.1 PIN FUNCTIONS, the INT and RESET pins also have a function to set a test
mode (for IC testing) in which the internal operations of the µPD17215 are tested.
When a voltage higher than VDD is applied to either of these pins, the test mode is set. This means that, even during
ordinary operation, the µPD17215 may be set in the test mode if a noise exceeding VDD is applied.
For example, if the wiring length of the INT or RESET pin is too long, noise superimposed on the wiring line of the pin
main cause the above problem.
Therefore, keep the wiring length of these pins as short as possible to suppress the noise; otherwise, take noise
preventive measures as shown below by using external components.
• Connect diode with low VF between VDD
and INT/RESET pin
• Connect capacitor between VDD and
INT/RESET pin
V DD
V DD
Diode with
low V F
V DD
INT, RESET
V DD
INT, RESET
If the test mode is set by the INT pin, low level is output from the WDOUT pin. In this case, connect the WDOUT and
RESET pin.
9

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