ADIS16250(Rev0) View Datasheet(PDF) - Analog Devices
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ADIS16250 Datasheet PDF : 20 Pages
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ADIS16250
STATUS AND DIAGNOSTICS
The ADIS16250 provides a number of status and diagnostic
functions. Table 25 provides a summary of these functions,
along with their appropriate control registers.
Table 25. Status and Diagnostic Functions
Function
Data-ready I/O indicator
Self test, mechanical check for MEMS sensor
Status
Check for predefined error conditions
Flash memory endurance
Alarms
Configure and check for user-specific
conditions
Register
MSC_CTRL
MSC_CTRL
STATUS
ENDURANCE
ALM_MAG1/2
ALM_SMPL1/2
ALM_CTRL
Data-Ready I/O Indicator
The data-ready function provides an indication of updated
output data. The MSC_CTRL register provides the opportunity
to configure either of the general-purpose I/O pins (DIO0 and
DIO1) as a data-ready indicator signal.
Table 26. MSC_CTRL Register Definition
Address
Default
Format
0x35, 0x34
0x0000
N/A
Access
R/W
Table 27. MSC_CTRL Bit Descriptions
Bit
Description
15:11 Not used
10
Internal self-test enable:
1 = enabled, 0 = disabled
9
External negative rotation self-test enable
1 = enabled, 0 = disabled
8
External positive rotation self-test enable
1 = enabled, 0 = disabled
7:3
Not used
2
Data-ready enable
1 = enabled, 0 = disabled
1
Data-ready polarity
1 = active high, 0 = active low
0
Data-ready line select
1 = DIO1, 0 = DIO0
Self Test
The MSC_CTRL register also provides a self-test function,
which verifies the MEMS sensor’s mechanical integrity. There
are two different self-test options: (1) internal self-test and (2)
external self-test. The internal test provides a simple, two-step
process for checking the MEMS sensor: (1) start the process by
writing a 1 to Bit 10 in the MSC_CTRL register and (2) check
the result by reading Bit 5 of the STATUS register.
For example, the standard 50 Hz bandwidth reflects an exponential
response with a time constant of 2 ms. Note that the digital filtering
impacts this delay as well. The appropriate bit definitions for self-
test are listed in Table 26 and Table 27.
Status Conditions
The STATUS register contains the following error-condition
flags: Alarm conditions, self-test status, angular rate over range,
SPI communication failure, control register update failure, and
power supply out of range. See Table 28 and Table 29 for the
appropriate register access and bit assignment for each flag.
The bits assigned for checking power supply range and angular
rate over range automatically reset to zero when the error
condition no longer exists. The remaining error-flag bits in the
STATUS register require a read in order to return them to zero.
Note that a STATUS register read clears all of the bits to zero.
Table 28. STATUS Register Definition
Address
Default
Format
0x3D, 0x3C 0x0000
N/A
Access
Read only
Table 29. STATUS Bit Descriptions
Bit Description
15:10 Not used
9
Alarm 2 status:
1 = active, 0 = inactive
8
Alarm 1 status
1 = active, 0 = inactive
7:6 Not used
5
Self-test diagnostic error flag
1 = error condition, 0 = normal operation
4
Angular rate over range
1 = error condition, 0 = normal operation
3
SPI communications failure
1 = error condition, 0 = normal operation
2
Control register update failed
1 = error condition, 0 = normal operation
1
Power supply in range above 5.25 V
1 = above 5.25 V, 0 = below 5.25V (normal)
0
Power supply below 4.75 V
1 = below 4.75 V, 0 = above 4.75V (normal)
Flash Memory Endurance
The ENDURANCE register maintains a running count of
writes to the flash memory.
Table 30. ENDURANCE Register Definition
Address
Default
Format
0x01, 0x00
N/A
Binary
Access
Read only
The external self-test is a static condition that can be enabled
and disabled. In this test, both positive and negative MEMS
sensor movements are available. After writing to the appropriate
control bit, the GYRO_OUT register reflects the changes after a
delay that reflects the sensor signal chain response time.
Rev. 0 | Page 18 of 20
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