ADUC812 View Datasheet(PDF) - Analog Devices
Part Name
Description
Manufacturer
ADUC812 Datasheet PDF : 60 Pages
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ADuC812
SPECIFICATIONS1, 2
(AVDD = DVDD = 3.0 V or 5.0 V ØŽ 10%, REFIN /REFOUT = 2.5 V Internal Reference, MCLKIN = 11.0592 MHz,
fSAMPLE = 200 kHz, DAC VOUT Load to AGND; RL = 2 kâ€, CL = 100 pF. All specifications TA = TMIN to TMAX, unless otherwise noted.)
Parameter
ADC CHANNEL SPECIFICATIONS
DC ACCURACY3, 4
Resolution
Integral Nonlinearity
Differential Nonlinearity
ADuC812BS
VDD = 5 V
VDD = 3 V
12
12
±1/2
±1/2
±1.5
±1.5
±1.5
±1.5
±1
±1
CALIBRATED ENDPOINT ERRORS5, 6
Offset Error
±5
±1
Offset Error Match
1
Gain Error
±6
±1
Gain Error Match
1.5
USER SYSTEM CALIBRATION7
Offset Calibration Range
±5
Gain Calibration Range
±2.5
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio (SNR)8
Total Harmonic Distortion (THD)
Peak Harmonic or Spurious Noise
ANALOG INPUT
Input Voltage Ranges
Leakage Current
Input Capacitance9
TEMPERATURE SENSOR10
Voltage Output at 25°C
Voltage TC
DAC CHANNEL SPECIFICATIONS
DC ACCURACY11
Resolution
Relative Accuracy
Differential Nonlinearity
Offset Error
Full-Scale Error
Full-Scale Mismatch
ANALOG OUTPUTS
Voltage Range_0
Voltage Range_1
Resistive Load
Capacitive Load
Output Impedance
ISINK
70
–78
–78
0 to VREF
±1
±0.1
20
600
–3.0
12
±3
±0.5
±60
±15
±30
±10
±0.5
0 to VREF
0 to VDD
10
100
0.5
50
±5
±1
1
±6
±1
1.5
±5
±2.5
70
–78
–78
0 to VREF
±1
±0.1
20
600
–3.0
12
±3
±1
±60
±15
±30
±10
±0.5
0 to VREF
0 to VDD
10
100
0.5
50
Unit
Test Conditions/Comments
Bits
LSB typ
LSB max
LSB typ
LSB typ
fSAMPLE = 100 kHz
fSAMPLE = 100 kHz
fSAMPLE = 200 kHz
fSAMPLE = 100 kHz. Guaranteed No
Missing Codes at 5 V
LSB max
LSB typ
LSB typ
LSB max
LSB typ
LSB typ
% of VREF typ
% of VREF typ
dB typ
dB typ
dB typ
fIN = 10 kHz Sine Wave
fSAMPLE = 100 kHz
V
µA max
µA typ
pF max
mV typ
mV/°C typ
Can vary significantly (> ±20%)
from device to device
Bits
LSB typ
LSB typ
mV max
mV typ
mV max
mV typ
% typ
V typ
V typ
kΩ typ
pF typ
Ω typ
µA typ
Guaranteed 12-Bit Monotonic
% of Full-Scale on DAC1
REV. E
–3–
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