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FSEZ2016NY(2009) View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
Manufacturer
FSEZ2016NY Datasheet PDF : 14 Pages
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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device
reliability. The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Min. Max. Unit
VDD
DC Supply Voltage(1, 2)
30
V
VFB Input Voltage to FB Pin
-0.3
7.0
V
VSENSE Input Voltage to Sense Pin
-0.3
7.0
V
PD
Power Dissipation (TA=25°C)
θJA Thermal Resistance (Junction to Air)
1.2
W
98.7
°C/W
TJ
Operating Junction Temperature
-40
150
°C
TSTG Storage Temperature Range
-55
150
°C
TL
Lead Temperature (Wave Soldering or IR, 10 Seconds)
260
°C
ESD
Electrostatic
Human Body Model (JEDEC:JESD22_A114)
Discharge Capability Charged Device Model (JEDEC:JESD22_C101)
2
KV
1
KV
Notes:
1. All voltage values, except differential voltages, are given with respect to GND pin.
2. Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
© 2008 Fairchild Semiconductor Corporation
FSEZ2016 Rev. 1.0.0
4
www.fairchildsemi.com

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