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LPC2104FBD48/01 View Datasheet(PDF) - NXP Semiconductors.

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LPC2104FBD48/01 Datasheet PDF : 41 Pages
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NXP Semiconductors
LPC2104/2105/2106
Single-chip 32-bit microcontrollers
Table 9. Static characteristics …continued
Tamb = 0 °C to +70 °C for commercial applications, unless otherwise specified.
Symbol Parameter
Conditions
Min
Oscillator pins
Vi(XTAL1) input voltage on pin XTAL1
0
Vo(XTAL2) output voltage on pin
0
XTAL2
Typ[1]
-
-
Max
1.8
1.8
[1] Typical ratings are not guaranteed. The values listed are at room temperature (+25 °C), nominal supply voltages.
[2] Internal rail.
[3] External rail.
[4] Including voltage on outputs in 3-state mode.
[5] VDD(3V3) supply voltages must be present.
[6] 3-state outputs go into 3-state mode when VDD(3V3) is grounded.
[7] Accounts for 100 mV voltage drop in all supply lines.
[8] Allowed as long as the current limit does not exceed the maximum current allowed by the device.
[9] Minimum condition for VI = 4.5 V, maximum condition for VI = 5.5 V.
[10] Applies to P0[31:22].
[11] SPI is enabled and SSP is disabled in the PCONP register (see LPC2104/2105/2106 user manual).
[12] To VSS.
Unit
V
V
8.1 Power consumption measurements for LPC2104/2105/2106/01
The power consumption measurements represent typical values for the given conditions.
The peripherals were enabled through the PCONP register, but for these measurements
the peripherals were not configured to run. Power measurements with all peripherals
enabled were performed with the SPI enabled and the SSP disabled. Peripherals were
disabled through the PCONP register. Refer to the LPC2104/2105/2106 User Manual for a
description of the PCONP register.
60
IDD(act)
(mA)
40
all peripherals enabled
all peripherals disabled
002aad709
20
LPC2104_2105_2106_7
Product data sheet
0
12
28
44
60
frequency (MHz)
Fig 5.
Test conditions: Active mode entered executing code from on-chip flash; PCLK = CCLK4;
Tamb = 25 °C; core voltage 1.8 V.
Typical LPC2104/2105/2106/01 IDD(act) measured at different frequencies
Rev. 07 — 20 June 2008
© NXP B.V. 2008. All rights reserved.
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