SPT7853 View Datasheet(PDF) - Cadeka Microcircuits LLC.
Part Name
Description
Manufacturer
SPT7853 Datasheet PDF : 10 Pages
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ELECTRICAL SPECIFICATIONS
TA=TMIN to TMAX, VDD=OVDD=+5.0 V, VIN=0 to 4 V, ƒS=30 MSPS, ƒCLK=60 MHz, VRHS=4.0 V, VRLS=0.0 V, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
Dynamic Performance
Spurious Free Dynamic Range
ƒIN = 3.58 MHz
@ 25 °C
@ 0 to 70 °C
Channel-to-Channel Cross Talk
ƒIN = 3.58 MHz
Channel-to-Channel Gain Matching
Differential Phase
Differential Gain
Power Supply Requirements
VDD Supply Voltage
OVDD Supply Voltage
Supply Current
IDD
OIDD
Power Dissipation
Without reference ladder
Including reference ladder
CL = 10 pF
CL = 10 pF
Digital Inputs/Outputs
Digital Input Logic 1 Voltage
Digital Input Logic 0 Voltage
Digital Output Logic 1 Voltage
Digital Output Logic 0 Voltage
tRISE/tFALL (CL = 10 pF)
OEN to Data Output
IOH = 500 µA
IOL = 800 µA
TEST
LEVEL
SPT7853
MIN
TYP
MAX UNITS
V
V
V
V
V
V
IV
+4.75
IV
+2.7
VI
V
V
VI
VI
4.0
VI
VI
OVDD –0.5
VI
V
V
65
56.3
–66
±0.1
0.5
0.5
+5.0
81
9
485
580
10
12
dBc
dBc
dB
dB
Degree
%
+5.25 V
+5.25 V
105 mA
11 mA
mW
750 mW
V
1.0 V
V
0.4 V
ns
ns
TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
III
cates the specific device testing actually per-
IV
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
V
tested at the specified condition.
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
SPT7853
3
12/14/99
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