HCPL-0601-020 View Datasheet(PDF) - HP => Agilent Technologies
Part Name
Description
Manufacturer
HCPL-0601-020 Datasheet PDF : 20 Pages
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16
PULSE GEN.
ZO = 50 Ω
t f = t r = 5 ns
INPUT VE
MONITORING NODE
1
7.5 mA
IF
2
3
4
VCC 8
7
6
5
GND
+5 V
0.1 µF
BYPASS
RL
OUTPUT VO
MONITORING
*CL
NODE
INPUT
VE
OUTPUT
VO
t EHL
t ELH
3.0 V
1.5 V
1.5 V
*CL IS APPROXIMATELY 15 pF WHICH INCLUDES
PROBE AND STRAY WIRING CAPACITANCE.
Figure 13. Test Circuit for tEHL and tELH.
120
VCC = 5.0 V
VEH = 3.0 V
VEL = 0 V
90 IF = 7.5 mA
tELH, RL = 4 kΩ
60
tELH, RL = 1 kΩ
30
tELH, RL = 350 Ω
0
tEHL, RL = 350 Ω, 1 kΩ, 4 kΩ
-60 -40 -20 0 20 40 60 80 100
TA – TEMPERATURE – °C
Figure 14. Typical Enable Propagation
Delay vs. Temperature.
IF
B
A
VFF
SINGLE CHANNEL
1
VCC 8
2
7
3
6
4
GND 5
+5 V
0.1 µF
BYPASS
RL
OUTPUT VO
MONITORING
NODE
IF
B
A
VFF
VCM
+–
PULSE
GENERATOR
ZO = 50 Ω
VCM (PEAK)
VCM 0 V
VO
5V
SWITCH AT A: IF = 0 mA
VO (MIN.)
SWITCH AT B: IF = 7.5 mA
VO 0.5 V
VO (MAX.)
DUAL CHANNEL
1
VCC 8
2
7
3
6
4
GND 5
VCM
+–
PULSE
GENERATOR
ZO = 50 Ω
CMH
CML
RL
0.1 µF
BYPASS
+5 V
OUTPUT VO
MONITORING
NODE
Figure 15. Test Circuit for Common Mode Transient Immunity and Typical Waveforms.
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