612 View Datasheet(PDF) - M.S. Kennedy Corporation
Part Name
Description
Manufacturer
612 Datasheet PDF : 4 Pages
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ABSOLUTE MAXIMUM RATINGS 6
±VHV
±VIN
±VCC
θJC
Supply Voltage ±80V T ○
○
○
○
○
○
○
○
○
○
○
○
○
DC
ST
Input Voltage Range
○
○
○
○
○
○
○
○
○
○
○ ±VCC
TLD
Supply Voltage (Input Stage) ○ ○ ○ ○ ○ ±18VDC
Thermal Resistance ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 30°C/W TC
(Output Devices)
TJ
Storage Temperature Range -65°C to +150°C
Lead Temperature Range ○ ○ ○ ○ ○ ○ ○ ○ ○ 300°C
(10 Seconds)
Case Operating Temperature
MSK612 ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ -40°C to +85°C
MSK612B/E ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ -55°C to +125°C
Junction Temperature ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 150°C
ELECTRICAL SPECIFICATIONS
Parameter
STATIC
Quiescent Current
Input Offset Voltage
Input Bias Current
Input Offset Voltage Drift 2
Power Supply Range 2
DYNAMIC CHARACTERISTICS
Output Voltage Swing
Peak Output Current 2
Full Power Output 2
Unity Gain Bandwidth 2
Slew Rate
Voltage Gain 2
Settling Time to 1% 2
Settling Time to 0.1% 2
Settling Time to 0.05%
Test Conditions 1
VIN=0 @ +VCC
VIN=0 @ -VCC
VIN=0 @ +VHV
VIN=0 @ -VHV
VIN=0
VIN=0
±VCC
±VHV
f=1KHz
f=1KHz
V0=±50V
V0=±1.0V
V0=±50V
VO=±50V f=1KHz
AV=-10V/V VO=±50V
AV=-10V/V VO=±50V
AV=-10V/V VO=±50V
Group A
MSK 612B/E
MSK 612
Subgroup Min. Typ. Max. Min. Typ. Max.
Units
1,2,3
1,2,3
1,2,3
1,2,3
1
2,3
1
2,3
2,3
-
-
- 1.0
- 12
- 12
- 12
- ±0.2
- ±1.0
- 50
- 100
- ±5
±12 ±15
±50 ±65
3.5 -
30 -
20 -
20 -
±5.0 -
±10 -
500 -
750 -
±50 -
±18 ±12
±80 ±50
1.0
15
12
12
±1.0
±2.0
50
100
±5
±15
±65
4.0
32
22
22
±10
-
750
-
-
±18
±80
mA
mA
mA
mA
mV
mV
nA
nA
µV/°C
V
V
4
±50 ±58
- ±50 ±58
-
V
-
±200 ±250 - ±200 ±250 -
mA
-
5 12
-
4
12
-
MHz
-
80 100
- 80 100
-
MHz
4
2000 5000 - 2000 5000
-
V/µS
4
90 100
- 90 100
-
dB
-
- 100
-
-
100
-
nS
-
- 400
-
-
400
-
nS
4
- 750 1.5 -
750 1.6
µS
NOTES:
1 Unless otherwise specified, ±VCC=±15VDC, ±VHV=±65VDC, CL=8pF (probe capacitance) and AV=10V/V.
2 This parameter is guaranteed by design but not tested. Typical parameters are representative of actual device performance but are for reference only.
3 Industrial grade and "E" suffix devices shall be tested to subgroups 1 and 4 unless otherwise specified.
4 Military grade devices ('B' suffix) shall be 100% tested to subgroups 1,2,3 and 4.
5 Subgroup 1,4 TA=TC=+25°C
Subgroup 2,5 TA=TC=+125°C
Subgroup 3,6 TA=TC=-55°C
6 Continuous operation at or above absolute maximum ratings may adversely effect the device performance and/or life cycle.
2
Rev. B
3/06
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