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STD2N62K3(2018) View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
STD2N62K3 Datasheet PDF : 27 Pages
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STD2N62K3, STF2N62K3, STU2N62K3
Electrical characteristics
Table 7. Source drain diode
Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
ISD
ISDM (1)
Source-drain current
Source-drain current
(pulsed)
2.2
-
A
8.8
VSD (2)
Forward on voltage
ISD = 2.2 A, VGS = 0 V
-
trr
Reverse recovery time
ISD = 2.2 A, di/dt = 100 A/µs
Qrr
IRRM
Reverse recovery charge VDD = 60 V (see Figure 18. Test circuit for
-
inductive load switching and diode recovery
Reverse recovery current times)
1.6
V
200
ns
0.9
μC
9
A
trr
Reverse recovery time
ISD = 2.2 A, di/dt = 100 A/µs
240
ns
Qrr
Reverse recovery charge VDD = 60 V, Tj = 150 °C(see Figure 18. Test
-
1.15
μC
circuit for inductive load switching and
IRRM
Reverse recovery current diode recovery times)
10
A
1. Pulse width limited by safe operating area.
2. Pulsed: pulse duration = 300 μs, duty cycle 1.5%.
Symbol
V(BR)GSO
Table 8. Gate-source Zener diode
Parameter
Gate-source breakdown
voltage
Test conditions
Igs = ±1 mA, ID = 0 A
Min. Typ. Max. Unit
±30
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD performance of the device.
The Zener voltage facilitates efficient and cost-effective device integrity protection, thus eliminating the need for
additional external componentry.
DS7248 - Rev 3
page 4/27

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