74ABT00DB View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
Manufacturer
74ABT00DB Datasheet PDF : 12 Pages
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Nexperia
74ABT00
Quad 2-input NAND gate
6. Functional description
Table 3. Function table[1]
Input
nA
nB
L
X
X
L
H
H
[1] H = HIGH voltage level; L = LOW voltage level; X = don’t care.
7. Limiting values
Output
nY
H
H
L
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter
Conditions
VCC
supply voltage
VI
input voltage
VO
output voltage
output HIGH or LOW
IIK
input clamping current
VI < 0 V
IOK
output clamping current
VO < 0 V
IO
output current
output in LOW-state
Tj
junction temperature
Tstg
storage temperature
Min
0.5
[1] 1.2
[1] 0.5
18
50
-
[2]
-
65
Max Unit
+7.0 V
+7.0 V
+5.5 V
-
mA
-
mA
40 mA
150 C
+150 C
[1] The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
[2] The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 C.
8. Recommended operating conditions
Table 5. Operating conditions
Voltages are referenced to GND (ground = 0 V).
Symbol Parameter
VCC
VI
VIH
VIL
IOH
IOL
t/V
supply voltage
input voltage
HIGH-level input voltage
LOW-level input voltage
HIGH-level output current
LOW-level output current
input transition rise and fall rate
Tamb
ambient temperature
Conditions
in free air
Min
Typ
Max Unit
4.5
-
5.5 V
0
-
VCC V
2.0
-
-
V
-
-
0.8 V
15
-
-
mA
-
-
20 mA
0
-
5 ns/V
40
-
+85 C
74ABT00
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 11 August 2016
© Nexperia B.V. 2017. All rights reserved
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