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74HC175(2016) View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
Manufacturer
74HC175
(Rev.:2016)
NXP
NXP Semiconductors. NXP
74HC175 Datasheet PDF : 19 Pages
First Prev 11 12 13 14 15 16 17 18 19
Nexperia
74HC175; 74HCT175
Quad D-type flip-flop with reset; positive-edge trigger
9, 
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SXOVH
*1'
9,
SRVLWLYH
SXOVH
*1' 
90

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WU

90
9,
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57
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90
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WI
90
92
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DDK

Test data is given in Table 9.
Definitions for test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
Fig 10. Test circuit for measuring switching times
Table 9. Test data
Type
Input
VI
tr, tf
74HC175
VCC
6 ns
74HCT175
3V
6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
Test
tPLH, tPHL
tPLH, tPHL
74HC_HCT175
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 29 January 2016
.
12 of 19
© Nexperia B.V. 2017. All rights reserved

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