MAL212016152E3 View Datasheet(PDF) - Vishay Semiconductors
Part Name
Description
Manufacturer
MAL212016152E3
Vishay Semiconductors
MAL212016152E3 Datasheet PDF : 8 Pages
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www.vishay.com
120 ATC
Vishay BCcomponents
Table 6
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
Endurance
IEC 60384-4 /
EN 130300
subclause 4.13
Tamb = 125 °C; UR applied;
4000 h
Tamb = 150 °C; UR applied;
1000 h
REQUIREMENTS
C/C: ± 15 %
tan 1.3 x spec. limit
Z 2 x spec. limit
IL5 spec. limit
Useful life
CECC 30301
subclause 1.8.1
Tamb = 125 °C; UR and IR applied;
8000 h
C/C: ± 45 %
tan 3 x spec. limit
Z 3 x spec. limit
IL5 spec. limit
no short or open circuit
total failure percentage: 1 %
Shelf life
(storage at high
temperature)
IEC 60384-4 /
EN 130300
subclause 4.17
Tamb = 125 °C; no voltage applied;
1000 h (100 V: 500 h)
Tamb = 150 °C; no voltage applied;
500 h for voltages: 63 V
After test: UR to be applied for 30 min,
24 h to 48 h before measurement
C/C, tan , Z:
for requirements
see “Endurance test” above
IL5 2 x spec. limit
Reverse voltage
IEC 60384-4 /
EN 130300
subclause 4.15
Tamb = 125 °C:
125 h at U = -1 V
Followed by 125 h at UR
C/C: ± 20 %
tan spec. limit
IL5 spec. limit
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
Revision: 02-Sep-2019
6
Document Number: 28336
For technical questions, contact: aluminumcaps1@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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