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MAC7101MVM50 View Datasheet(PDF) - Freescale Semiconductor

Part Name
Description
Manufacturer
MAC7101MVM50
Freescale
Freescale Semiconductor Freescale
MAC7101MVM50 Datasheet PDF : 56 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Electrical Characteristics
Table 4. Absolute Maximum Ratings (continued)
Num
Rating
Symbol
Min
Max
Unit
A9 Voltage difference VDDA – VRH
VDDA – VRH
–0.3
+6.0
V
A10 Digital I/O Input Voltage
VIN
–0.3
+6.0
V
A11 XFC, EXTAL, XTAL inputs
A12 TEST input
Instantaneous Maximum Current 3
VILV
VTEST
–0.3
–0.3
+3.0
V
2
V
A13 Single pin limit for XFC, EXTAL, XTAL 4
A14 Single pin limit for all digital I/O pins 5
A15 Single pin limit for all analog input pins 5
A16 Single pin limit for TEST 2
IDL
–25
+25
mA
ID
–25
+25
mA
IDA
–25
+25
mA
IDT
–0.25
0
mA
A17 Storage Temperature Range
Tstg
–65
+155
°C
NOTES:
1. The device contains an internal voltage regulator to generate the logic and PLL supply from the I/O supply. The
absolute maximum ratings apply when the device is powered from an external source.
2. This pin is clamped low to VSSX, but not clamped high, and must be tied low in applications.
3. Input must be current limited to the value specified. To determine the value of the required current-limiting resistor,
use the larger of the calculated values using VPOSCLAMP = VDDA + 0.3V and VNEGCLAMP = –0.3 V.
4. These pins are internally clamped to VSSPLL and VDDPLL.
5. All I/O pins are internally clamped to VSSX and VDDX, VSSR and VDDR or VSSA and VDDA.
3.3 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise.
Table 5. ESD and Latch-up Test Conditions
Model
Human Body
Machine
Latch-up
Description
Series Resistance
Storage Capacitance
Number of Pulses per pin
positive
negative
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Minimum input voltage limit
Maximum input voltage limit
Symbol
R1
C
R1
C
Value
1500
100
3
3
0
200
3
3
–2.5
7.5
Unit
Ohm
pF
Ohm
pF
V
V
MAC7100 Microcontroller Family Hardware Specifications, Rev. 1.2
Freescale Semiconductor
Preliminary
5

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