ATTL7554AP View Datasheet(PDF) - Agere -> LSI Corporation

Part Name

Description

Manufacturer

ATTL7554AP

L7554 Low-Power SLIC

Agere -> LSI Corporation 

Data Sheet

March 1997

Test Configurations (continued)

100 µF

PT

VS

368 Ω

+

BASIC

VM

TEST CIRCUIT

368 Ω

–

PR

100 µF

LONGITUDINAL BALANCE = 20 log -V----S-

VM

12-2584 (C)

Figure 7. Longitudinal Balance

L7554 Low-Power SLIC

ILONG

ILONG

PT

+

VPT

–

BASIC

–

TEST CIRCUIT

VPR

+

PR

ZLONG =

∆ VPT OR ∆ VPR

∆ ILONG

∆ ILONG

12-2585 (C)

Figure 9. Longitudinal Impedance

0.01 µF

50 Ω

VS

600 Ω

2.15

µF

0.01 µF

82.5 Ω

PT

1

6,7

2

LB1201

VBAT

4

BASIC

TEST CIRCUIT

PR

82.5 Ω

HP4935A

TIMS

VS = 0.5 Vrms 30% AM 1 kHz MODULATION,

f = 500 kHz––1 MHz

DEVICE IN POWERUP MODE, 600 Ω TERMINATION

Figure 8. RFI Rejection

12-2586 (C)

600 Ω

PT

+

BASIC

VT/R

TEST CIRCUIT

–

PR

XMT

RCV

VS

VXMT

GXMT = VT/R

GRCV =

VT/R

VRCV

Figure 10. ac Gains

12-2587 (C)

Lucent Technologies Inc.

13

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