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Part Name
Description
ATF22LV10CQZ-30JI_05 View Datasheet(PDF) - Atmel Corporation
Part Name
Description
Manufacturer
ATF22LV10CQZ-30JI_05
High-performance EE PLD
Atmel Corporation
ATF22LV10CQZ-30JI_05 Datasheet PDF : 19 Pages
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4.1 DC Characteristics
Symbol Parameter
Condition
(2)
Min
Typ
Max
I
IL
Input or I/O Low
Leakage Current
0
≤
V
IN
≤
V
IL
(Max)
-10.0
I
IH
Input or I/O High
Leakage Current
(V
CC
- 0.2)V
≤
V
IN
≤
V
CC
10.0
I
CC
Clocked Power
Supply Current
V
CC
= Max
Outputs Open,
f = 15 MHz
CZ-25
CZ-25
CQZ-30
CQZ-30
Com.
Ind.
Com.
Ind.
50.0
85.0
55.0
90.0
18.0
50.0
19.0
60.0
CZ-25 Com.
I
SB
Power Supply Current,
Standby
V
CC
= Max
V
IN
= Max
Outputs Open
CZ-25
CQZ-30
Ind.
Com.
CQZ-30 Ind.
3.0
25.0
4.0
50.0
3.0
25.0
4.0
50.0
I
OS(1)
Output Short Circuit
Current
V
OUT
= 0.5V
-130.0
V
IL
V
IH
V
OL
V
OH
V
OH
Note:
Input Low Voltage
-0.5
0.8
Input High Voltage
2.0
V
CC
+ 0.75
V
IN
= V
IH
or V
IL
Output Low Voltage
V
CC
= Min,
0.5
I
OL
= 16 mA
V
IN
= V
IH
or V
IL
Output High Voltage
V
CCIO
= Min,
2.4
I
OH
= -2.0 mA
Output High Voltage
I
OH
= -100 µA
V
CC
- 0.2V
1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
2. For DC characterization, the test condition of V
CC
= Max corresponds to 3.6V.
Units
µA
µA
mA
mA
mA
mA
µA
µA
µA
µA
mA
V
V
V
V
V
4
ATF22LV10C(Q)Z
0779L–PLD–12/05
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