Input Test Waveforms and
Measurement Levels
ATF22LV10CZ
Output Test Loads
Note: Similar competitors’ devices are specified
with slightly different loads. These load differ-
ences may affect output signals’ delay and slew
rate. Atmel devices are tested with sufficient
margins to meet compatible device specification
conditions.
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ
Max
Units
Conditions
CIN
5
8
pF
VIN = 0V
COUT
6
8
pF
VOUT = 0V
Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
5