MFRC522_ View Datasheet(PDF) - NXP Semiconductors.

Part Name

Description

Manufacturer

MFRC522_

Contactless reader IC

NXP Semiconductors. 

NXP Semiconductors

Table 134. AnalogTestReg register bit descriptions . . . . .64

Table 135. TestDAC1Reg register (address 39h);

reset value: xxh bit allocation . . . . . . . . . . . . .65

Table 136. TestDAC1Reg register bit descriptions . . . . . .65

Table 137. TestDAC2Reg register (address 3Ah);

reset value: xxh bit allocation . . . . . . . . . . . . .65

Table 138. TestDAC2Reg register bit descriptions . . . . . .65

Table 139. TestADCReg register (address 3Bh);

reset value: xxh bit allocation . . . . . . . . . . . . .65

Table 140. TestADCReg register bit descriptions . . . . . . .65

Table 141. Reserved register (address 3Ch);

reset value: FFh bit allocation . . . . . . . . . . . . .66

Table 142. Reserved register bit descriptions . . . . . . . . . .66

Table 143. Reserved register (address 3Dh);

reset value: 00h bit allocation . . . . . . . . . . . . .66

Table 144. Reserved register bit descriptions . . . . . . . . . .66

Table 145. Reserved register (address 3Eh);

reset value: 03h bit allocation . . . . . . . . . . . . .66

Table 146. Reserved register bit descriptions . . . . . . . . . .66

Table 147. Reserved register (address 3Fh);

reset value: 00h bit allocation . . . . . . . . . . . . .66

Table 148. Reserved register bit descriptions . . . . . . . . . .66

Table 149. Command overview . . . . . . . . . . . . . . . . . . . .67

Table 150. Limiting values . . . . . . . . . . . . . . . . . . . . . . . .71

Table 151. Operating conditions . . . . . . . . . . . . . . . . . . . .71

Table 152. Thermal characteristics . . . . . . . . . . . . . . . . . .71

Table 153. Characteristics . . . . . . . . . . . . . . . . . . . . . . . .72

Table 154. SPI timing characteristics . . . . . . . . . . . . . . . .75

Table 155. I2C-bus timing in Fast mode . . . . . . . . . . . . . .76

Table 156. Test bus signals: TestBusSel[4:0] = 07h . . . . .80

Table 157. Test bus signals: TestBusSel[4:0] = 0Dh . . . . .80

Table 158. Test signal descriptions . . . . . . . . . . . . . . . . . .80

Table 159. Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . .87

Table 160. Revision history . . . . . . . . . . . . . . . . . . . . . . . .88

MFRC522

Contactless reader IC

MFRC522_34

Product data sheet

PUBLIC

All information provided in this document is subject to legal disclaimers.

Rev. 3.4 — 5 March 2010

112134

© NXP B.V. 2010. All rights reserved.

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