JTS8388B-1V1B View Datasheet(PDF) - Unspecified

Part Name

Description

Manufacturer

JTS8388B-1V1B

ADC 8-bit 1 Gsps

Unspecified 

TS8388B

5.5 Explanation of Test Levels

Table 5-4.

No.

1

2

3

4

5

6

Explanation of Test Levels

Characteristics

100% production tested at +25°C(1) (for “C” Temperature range(2)).

100% production tested at +25°C(1), and sample tested at specified temperatures

(for “V” and “M” Temperature range(2)).

Sample tested only at specified temperatures.

Parameter is guaranteed by design and characterization testing (thermal steady-state

conditions at specified temperature).

Parameter is a typical value only.

100% production tested over specified temperature range

(for “B/Q” Temperature range(2)).

Notes:

1. Unless otherwise specified, all tests are pulsed tests: therefore TJ = Tc = Tamb, where TJ, Tc and TA are

junction, case and ambient temperature respectively.

2. Refer to “Ordering Information” on page 52.

3. Only MIN and MAX values are guaranteed (typical values are issuing from characterization results).

5.6 Functions Description

Table 5-5. Functions Description

Name

Function

VCC

VEE

VPLUSD

GND

Positive power supply

Analog negative power supply

Digital positive power supply

Ground

VIN, VINB

CLK, CLKB

Differential analog inputs

Differential clock inputs

<D0:D7>

<D0B:D7B>

Differential output data port

DR, DRB

Differential data ready outputs

OR, ORB

Out-of-range outputs

GAIN

ADC gain adjust

GORB

Gray or Binary digital output select

DIOD/DRRB

Die junction temperature measurement/

asynchronous data ready reset

VCC = +5V

VPLUSD = +0V (ECL)

VPLUSD = +2.4V (LVDS)

VIN

VINB

CLK

CLKB

GAIN

GORG

DIOD/

DRRB

TS8388B

OR

ORB

D0

16 D0B

DR

DRB

D7

D7B

DVEE = -5V VEE = -5V GND

e2v semiconductors SAS 2009

11

0860F–BDC–12/09

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