CXD2434TQ View Datasheet(PDF) - Sony Semiconductor

Part Name

Description

Manufacturer

CXD2434TQ

Timing Generator for Progressive Scan CCD Image Sensor

Sony Semiconductor 

3) Phase conditions of HD, VD, TRIG, EFS and ESG

CL

HD, VD, TRIG,

EFS, ESG

0.5VDD

0.5VDD

tSETUP

tHOLD

0.5VDD

CXD2434TQ

VDD = 5.0 V, Topr = 25 °C, load capacitance of CL = 30 pF

Symbol

tSETUP

tHOLD

Definition

HD, VD, TRIG, EFS and ESG setup time, activated by CL

HD, VD, TRIG, EFS and ESG hold time, activated by CL

Min. Typ. Max. Unit

20

ns

5

ns

4) Phase characteristics of XV1, XV2, XV3, XSG, PBLK, XCPDM, XCPOB, BUSY, WEN and ID

CL

0.5VDD

XV1, XV2, XV3

BUSY, WEN, ID

XSG, PBLK,

XCPDM, XCPOB

0.5VDD

tPDCL1

0.5VDD

tPDCL2

0.5VDD

tPDCL3

0.5VDD

VDD = 5.0 V, Topr = 25 °C, load capacitance of CL = 30 pF,

load capacitance of XV1, XV2, XV3, XSG, PBLK, XCPDM, XCPOB, BUSY, WEN and ID = 10 pF

Symbol

Definition

Min. Typ. Max. Unit

tPDCL1 XV1, XV2 and XV3 delay, activated by the falling edge of CL 30

65

ns

tPDCL2 BUSY, WEN and ID delay, activated by the rising edge of CL 40

60

ns

XSG, PBLK, XCPDM and XCPOB delay, activated by the

tPDCL3

40

rising edge of CL

55

ns

—7—

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