HCF4095B View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
HCF4095B Datasheet PDF : 11 Pages
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HCF4095B
Test Condition
Value
Symbol
Parameter
VI
VO
|IO| VDD
TA = 25°C
-40 to 85°C -55 to 125°C Unit
(V)
(V) (µA) (V) Min. Typ. Max. Min. Max. Min. Max.
II Input Leakage
Current
0/18 Any Input 18
±10-5 ±0.1
±1
CI Input Capacitance
Any Input
5 7.5
The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
±1 µA
pF
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
Symbol
Parameter
VDD (V)
tPLH tPHL Propagation Delay Time
5
10
15
tPLH tPHL Propagation Delay Time
5
(Set or Reset)
10
15
tTLH tTHL Transition Time
5
10
15
fCL Maximum Clock Input
5
Frequency
10
15
tW Clock Pulse Width
5
10
15
tr, tf Clock input Rise or Fall Time
5
10
15
tW Set or Reset Pulse Width
5
10
15
tsetup Data Setup Time
5
10
15
(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.
Test Condition
Value (*)
Unit
Min. Typ. Max.
250 500
100 200 ns
75 150
150 300
75 150 ns
50 100
100 200
50 100 ns
40 80
3.5 7
8 16
MHz
12 24
140 70
60 30
ns
40 20
15
5 µs
5
200 100
100 50
ns
50 25
400 200
160 80
ns
100 50
5/11
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