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74AHC244D-Q100 View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
Manufacturer
74AHC244D-Q100
NXP
NXP Semiconductors. NXP
74AHC244D-Q100 Datasheet PDF : 17 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Nexperia
74AHC244-Q100; 74AHCT244-Q100
Octal buffer/line driver; 3-state
tW
VI 90 %
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Fig 8.
Test data is given in Table 9.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator
CL = Load capacitance including jig and probe capacitance
RL = Load resistor
S1 = Test selection switch
Test circuit for measuring switching times
Table 9. Test data
Type
Input
VI
74AHC244-Q100 VCC
74AHCT244-Q100 3.0 V
tr, tf
3.0 ns
3.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74AHC_AHCT244_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 9 July 2012
© Nexperia B.V. 2017. All rights reserved
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