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CXD1914Q View Datasheet(PDF) - Sony Semiconductor

Part Name
Description
Manufacturer
CXD1914Q
Sony
Sony Semiconductor Sony
CXD1914Q Datasheet PDF : 41 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
CXD1914Q
Pin
Symbol
No.
82 TD8
83 TD9
84 TD10
85 XTEST1
86 XTEST2
87 XTEST3
88 XTEST4
89 XTEST5
90 VSS5
91 TDI
92 TMS
93 TDO
94 TCK
95 TRST
96 VDD5
97 NC
98 NC
99 NC
100 NC
I/O
Description
I/O Test data I/Os. These pins should be open.
I/O In the test mode, these are used for the internal circuit test data bus. The test
I/O data bus is available only for the device vendor.
I
I Test mode control signal inputs. These pins are pulled up. When all these
I pins are “H”, the CXD1914Q is not in the test mode, but is in the normal mode.
I The test mode is available only for the device vendor.
I
— Digital ground.
I Test pin. Set “H”. This pin is pulled up.
I Test pin. Set “H”. This pin is pulled up.
O Test pin. This pin should be open.
I Test pin. Set “H”.
Reset signal input for JTAG in active low.
I
This pin is pulled up.
— Digital power supply.
— Not connected inside the IC.
— Not connected inside the IC.
— Not connected inside the IC.
— Not connected inside the IC.
—6—

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