MKL33Z128VLH4 View Datasheet(PDF) - NXP Semiconductors.

Part Name

Description

Manufacturer

MKL33Z128VLH4

Kinetis KL33 Microcontroller 48 MHz ARM® Cortex®-M0+ and 128/256 KB Flash

NXP Semiconductors. 

Ratings

1 Ratings

1.1 Thermal handling ratings

Table 1. Thermal handling ratings

Symbol

TSTG

TSDR

Description

Storage temperature

Solder temperature, lead-free

Min.

–55

—

Max.

150

260

Unit

Notes

°C

1

°C

2

1. Determined according to JEDEC Standard JESD22-A103, High Temperature Storage Life.

2. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic

Solid State Surface Mount Devices.

1.2 Moisture handling ratings

Table 2. Moisture handling ratings

Symbol Description

MSL Moisture sensitivity level

Min.

—

Max.

3

Unit

Notes

—

1

1. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic

Solid State Surface Mount Devices.

1.3 ESD handling ratings

Table 3. ESD handling ratings

Symbol

VHBM

VCDM

ILAT

Description

Electrostatic discharge voltage, human body model

Electrostatic discharge voltage, charged-device

model

Latch-up current at ambient temperature of 105 °C

Min.

–2000

–500

–100

Max.

+2000

+500

+100

Unit

V

V

mA

Notes

1

2

3

1. Determined according to JEDEC Standard JESD22-A114, Electrostatic Discharge (ESD) Sensitivity Testing Human

Body Model (HBM).

2. Determined according to JEDEC Standard JESD22-C101, Field-Induced Charged-Device Model Test Method for

Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components.

3. Determined according to JEDEC Standard JESD78, IC Latch-Up Test.

4

Freescale Semiconductor, Inc.

Kinetis KL33 Microcontroller, Rev.5, 08/2015.

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