SANKEN ELECTRIC
2SK3710
http://www.sanken-ele.co.jp
May. 2011
Fig.1 Unclamped Inductive Test Method
L
IL
V DS
RG
VDD
V GS
0V
EAS= 1 ・L・ILP2・ V(BR)DSS
2
V(BR)DSS VDD
dv/dt 1
V(BR)DSS
ILp
IL
VDD
(a) Test Circuit
Fig.2 Diode Reverse Recovery Time Test Method
(b) Waveforms
ISD
D.U.T
VDS
ISD
L
VDD
di/dt
trr
IRM
VDD
RG
V GS
dv/dt 2
0V
VSD
(a) Test Circuit
(b) Waveforms
Fig.3 Switching Time Test Method
RL
VGS
0V
P.W.=10μs
Duty cycle≦1%
ID
VDS
RG
VDD
RGS
(a) Test Circuit
90%
VGS
10%
VDS
td(on)
tr
ton
90%
10%
td(off)
tf
toff
(b) Waveforms
The information included herein is believed to be accurate and reliable. However, SANKEN ELECTRIC CO., LTD assumes no
responsibility for its use ; nor for any infringements of patents or other rights of third parties that may result from its use.
Copy Right: SANKEN ELECTRIC CO.,LTD.
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