5.0 MEASUREMENT TEST
CIRCUITS (MTC)
A
0.1μF
VDD
XIN
CLK
XOUT
OE^ GND
FET
Probe
CL
FIGURE 5-1:
MTC-1: Rise Time, Fall
Time, Duty Cycle, VOL, VOH, IDD, Power Down
Current, Output Enable/Disable.
0.1μF
VDD
XIN
CLK
XOUT
OE^ GND
FET
Probe
0.1μF V
FIGURE 5-2:
MTC-2: Output Drive
Current and Output Impedance.
PL610-01
0.1μF
VDD
XIN
CLK
XOUT
OE^ GND
R 0.1μF
FIGURE 5-3:
Noise.
MTC-3: Jitter and Phase
Network
Analyzer
VDD
XIN
CLK
XOUT
OE^ GND
0.1μF
FIGURE 5-4:
Resistance.
MTC-4 Negative
2016 Microchip Technology Inc.
DS20005615A-page 9