VNQ810(2004) View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
VNQ810 Datasheet PDF : 21 Pages
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VNQ810
ELECTRICAL CHARACTERISTICS (continued)
LOGIC INPUT (Per each channel)
Symbol
VIL
IIL
VIH
IIH
VI(hyst)
VICL
Parameter
Input Low Level
Low Level Input Current
Input High Level
High Level Input Current
Input Hysteresis Voltage
Input Clamp Voltage
Test Conditions
VIN=1.25V
VIN=3.25V
IIN=1mA
IIN=-1mA
STATUS PIN (Per each channel)
Symbol
VSTAT
ILSTAT
CSTAT
VSCL
Parameter
Test Conditions
Status Low Output Voltage ISTAT=1.6mA
Status Leakage Current Normal Operation; VSTAT=5V
Status Pin Input
Capacitance
Normal Operation; VSTAT=5V
Status Clamp Voltage
ISTAT=1mA
ISTAT=-1mA
PROTECTIONS (Per each channel) (see note 1)
Symbol
TTSD
TR
Thyst
tsdl
Parameter
Shut-down Temperature
Reset Temperature
Thermal Hysteresis
Status Delay in Overload
Conditions
Test Conditions
Tj>TTSD
Ilim
VDEMAG
Current limitation
Turn-off Output Clamp
Voltage
5.5V<VCC<36V
IOUT=1A; L=6mH
Min Typ Max Unit
1.25
V
1
µA
3.25
V
10
µA
0.5
V
6
6.8
8
V
-0.7
V
Min Typ Max Unit
0.5
V
10
µA
100
pF
6
6.8
8
V
-0.7
V
Min Typ Max Unit
150 175 200
°C
135
°C
7
15
°C
20
µs
3.5
5
7.5
A
7.5
A
VCC-41 VCC-48 VCC-55 V
Note 1: To ensure long term reliability under heavy overload or short circuit conditions, protection and related diagnostic signals must be used
together with a proper software strategy. If the device is subjected to abnormal conditions, this software must limit the duration and number
of activation cycles.
OPENLOAD DETECTION (Per each channel)
Symbol
IOL
tDOL(on)
VOL
tDOL(off)
Parameter
Openload ON State
Detection Threshold
Openload ON State
Detection Delay
Openload OFF State
Voltage Detection
Threshold
Openload Detection Delay
at Turn Off
VIN=5V
IOUT=0A
VIN=0V
Test Conditions
Min Typ Max Unit
20
40
80
mA
200
µs
1.5
2.5
3.5
V
1000 µs
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