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UES1105 View Datasheet(PDF) - New Jersey Semiconductor

Part Name
Description
Manufacturer
UES1105
NJSEMI
New Jersey Semiconductor NJSEMI
UES1105 Datasheet PDF : 3 Pages
1 2 3
LJES804
UESB04HR2
UES805
UES806HR2
UES806
UES806HR2
Maximum Forward Surge
vs. Number of Cycles
X 600
500
s.
\H i c
*o
V
\E
300
\-
/ 200
K-
100
II
2
i 10 20
50 100 200
N — CYCLES OF 60 HI SINEWAVE
Thermal Impedance
<n. fain Width
«^-
Ss s r^
s/
/*
y
/
/
/
102 .05.1 .J .! » Z $ 1020 50100200 1«
I,— PULSE WIDTH (mS>
Reverse-Recovery Circuit
1
v1
1DQ
-»v
i
Me ,
VOX.)
~^
PULSE
NDTtS:
1. Otcilloseop*: Rise time ^ 3n»; input impedance = 900.
2. Pulse Generator; Rise time < 8ns; source Impedance 100.
3. Current viewing resistor, non-inductive, coaxial recommended.
OPTIONAL HIGH RELIABILITY (HR2) SCREENING
The fallowing to*U are performed on 100% of the devices spedfW UES804HR2.5HR2,6HR2.
SCREEN
1. High Temperature
2. Temperature Cycle
3. Hermetic Seal
a. Fine Leak
b. Gross Leak
4. Thermal Impedance
b. Interim Electrical Parameters
6. High Temperature Reverse Blocking
7. Final Electrical Parameters
MIL-STD-750
METHOD
1032
1051
1071
GO/NO GO
Similar to
Method 1040
GO/NO GO
CONDITIONS
24 Hours & TA . 150°C
F, 20 Cycles, -55 to +150*0 No dwell required
@ 25°C, t > 10 min. ® extremes
H, Helium
C, Liquid
Sage Test
VFandlR(025°C
W Sine Reverse, t = 48 Hours, Tc - 125<C, VRWM
= rating, F = 5O-60 Hz, lo - OA
VF + IR025-C
PDA - 10% (Final Etocthcals)

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