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3D7503 View Datasheet(PDF) - Data Delay Devices

Part Name
Description
Manufacturer
3D7503
Data-Delay-Devices
Data Delay Devices Data-Delay-Devices
3D7503 Datasheet PDF : 5 Pages
1 2 3 4 5
3D7503
AUTOMATED TESTING - MONOLITHIC PRODUCTS
TEST CONDITIONS
INPUT:
Ambient Temperature: 25oC ± 3oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width:
PWIN = 1/(2*BAUD)
Period:
PERIN = 1/BAUD
OUTPUT:
Rload:
Cload:
Threshold:
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Device
Under
Test
10K
470
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
WAVEFORM
GENERATOR
OUT
TRIG
IN DEVICE UNDER OUT IN
TEST (DUT)
TRIG
DIGITAL SCOPE
Figure 3: Test Setup
tRISE
PWIN
PERIN
tFALL
INPUT
2.4V
VIH
2.4V
SIGNAL
1.5V
0.6V
1.5V
0.6V
VIL
tPLH
tPHL
OUTPUT
SIGNAL
1.5V
VOH
1.5V
VOL
Figure 4: Timing Diagram
Doc #98009
DATA DELAY DEVICES, INC.
5
12/11/98
3 Mt. Prospect Ave. Clifton, NJ 07013

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