M2716F1 View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
M2716F1 Datasheet PDF : 9 Pages
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M2716
AC MEASUREMENT CONDITIONS
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
≤ 20ns
0.45V to 2.4V
0.8V to 2.0V
Note that Output Hi-Z is defined as the point where data
is no longer driven.
Figure 3. AC Testing Input Output Waveforms
2.4V
0.45V
2.0V
0.8V
AI00827
Figure 4. AC Testing Load Circuit
1.3V
1N914
DEVICE
UNDER
TEST
3.3kΩ
OUT
CL = 100pF
CL includes JIG capacitance
AI00828
Table 4. Capacitance (1) (TA = 25 °C, f = 1 MHz )
Symbol
Parameter
CIN
Input Capacitance
COUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
Test Condition
VIN = 0V
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
Table 5. Read Mode DC Characteristics (1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC = 5V ± 5% or 5V ± 10%; VPP = VCC)
Symbol
Parameter
Test Condition
Min
ILI
Input Leakage Current
0 ≤ VIN ≤ VCC
ILO
Output Leakage Current
VOUT = VCC, EP = VCC
ICC
Supply Current
EP = VIL, G = VIL
ICC1
Supply Current (Standby)
EP = VIH, G = VIL
IPP
Program Current
VPP = VCC
VIL
Input Low Voltage
–0.1
VIH
Input High Voltage
2
VOL
Output Low Voltage
IOL = 2.1mA
VOH Output High Voltage
IOH = –400µA
2.4
Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
Max
Unit
±10
µA
±10
µA
100
mA
25
mA
5
mA
0.8
V
VCC + 1
V
0.45
V
V
4/9
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