STQ-1016Z Просмотр технического описания (PDF) - Unspecified

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STQ-1016Z

Reliability Qualification Report

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STQ-2016Z Reliability Qualification Report

XII. Junction Temperature Determination

One key issue in performing qualification testing is to accurately determine the junction

temperature of the device. Sirenza Microdevices uses a 3um spot size emissivity

corrected infrared camera measurement to resolve the surface temperature of the device

at the maximum operational power dissipation. The results are displayed below for the

STQ-2016Z device running at operational current of Id= 80mA, a device voltage of 5V,

and lead temperature of 85°C.

Figure 2: Infrared Thermal Image of STQ-2016Z, Vd = 5.0V, Id =80mA, Tj = 98°C

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