Freescale Semiconductor, Inc.
DYNAMIC ELECTRICAL CHARACTERISTICS
Characteristics noted under conditions 4.5 V ≤ VDD ≤ 5.5 V, 6.0 V ≤ VPWR ≤ 27 V, -40°C ≤ TJ ≤ 150°C unless otherwise noted. Typical
values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
POWER OUTPUT TIMING
Output Rising Slow Slew Rate A (DICR D3 = 0) (Note 18)
SRRA_SLOW
V/µs
9.0 V < VPWR < 16 V
0.2
0.6
1.2
Output Rising Slow Slew Rate B (DICR D3 = 0) (Note 19)
SRRB_SLOW
9.0 V < VPWR < 16 V
0.03
0.1
V/µs
0.3
Output Rising Fast Slew Rate A (DICR D3 = 1) (Note 18)
SRRA_FAST
V/µs
9.0 V < VPWR < 16 V
0.4
1.0
4.0
Output Rising Fast Slew Rate B (DICR D3 = 1) (Note 19)
SRRB_FAST
9.0 V < VPWR < 16 V
0.03
0.1
V/µs
1.2
Output Falling Slow Slew Rate A (DICR D3 = 0) (Note 18)
SRFA_SLOW
V/µs
9.0 V < VPWR < 16 V
0.2
0.6
1.2
Output Falling Slow Slew Rate B (DICR D3 = 0) (Note 19)
SRFB_SLOW
9.0 V < VPWR < 16 V
0.03
0.1
V/µs
0.3
Output Falling Fast Slew Rate A (DICR D3 = 1) (Note 18)
SRFA_FAST
V/µs
9.0 V < VPWR < 16 V
0.8
2.0
4.0
Output Falling Fast Slew Rate B (DICR D3 = 1) (Note 19)
9.0 V < VPWR < 16 V
SRFB_FAST
0.1
0.35
V/µs
1.2
Notes
18. Rise and Fall Slew Rates A measured across a 5.0 Ω resistive load at high-side output = 0.5 V to VPWR-3.5 V. These parameters are
guaranteed by process monitoring.
19. Rise and Fall Slow Slew Rates B measured across a 5.0 Ω resistive load at high-side output = 0.5 V to VPWR-3.5 V. These parameters are
guaranteed by process monitoring.
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