MCP3021
Note: Unless otherwise indicated, VDD = 5V, VSS = 0V, I2C Fast Mode Timing (SCL = 400 kHz), Continuous Conversion
Mode (fSAMP = 22.3 ksps), TA = +25°C.
2.1 Test Circuit
1000
100
10
VDD = 5V
1
0.1
0.01
0.001
0.0001
-50 -25
FIGURE 2-37:
Temperature.
0
25
50
75
Temperature (°C)
100 125
IDDS (Standby) vs.
2
1.8
1.6
1.4
1.2
1
0.8
0.6
0.4
0.2
0
-50
-25
0
25
50
75
Temperature (°C)
100 125
10 µF 0.1 µF
2 kΩ
AIN
VDD SDA
MCP3021
VIN
VSS SCL
2 kΩ
VCM = 2.5V
FIGURE 2-39:
Typical Test Configuration.
FIGURE 2-38:
Temperature.
Analog Input Leakage vs.
2003 Microchip Technology Inc.
DS21805A-page 11