ST8024CD Просмотр технического описания (PDF) - STMicroelectronics

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ST8024CD

COM/SEG LCD Driver

STMicroelectronics 

ST8024

Table 7: Card Supply Voltage Characteristics (VDD = 3.3V, VDDP = 5V, fXTAL = 10MHz,

unless otherwise noted. Typical values are to Ta = 25°C) (Note 1)

Symbol

Parameter

Test Conditions

CVCC

VCC

VCC

(RIPPLE)

(P-P)

|ICC|

SR

External Capacitance on pin Notes 2 and 3

VCC

Card Supply Voltage

(including ripple voltage)

Card Inactive; |ICC| = 0 mA 5 and 3V card

Card Inactive; |ICC| = 1 mA 5 and 3V card

Card Active; |ICC| < 80 mA 5 V card

Card Active; |ICC| < 65 mA 3 V card

Card Active; single current 5 V card

pulse IP =-100 mA; tp=2 µs

Card Active; single current 3 V card

pulse IP =-100 mA; tp =2 µs

Card active; current pulses, 5 V card

QP = 40 nAs

3 V card

Card Active; current pulses 5 V card

QP =40 nAs with

3 V card

|ICC| < 200mA, tp < 400 ns

Ripple voltage on VCC

(Peak to Peak value)

fRIPPLE = 20 KHz to 200 MHz

Card Supply Current

Slew Rate

VCC = 0 to 5V

VCC = 0 to 3V

VCC short circuit to GND

Slew up or down

Min.

80

-0.1

-0.1

4.75

2.85

4.65

2.76

4.65

2.76

4.65

2.76

90

0.08

Typ. Max. Unit

220 nF

0

0.1 V

0

0.3

5 5.25

3 3.15

5 5.25

3 3.20

5 5.25

3 3.20

5 5.25

3 3.20

350 mV

0.15

80

65

120

0.22

mA

V/µs

Table 8: Crystal Connection (PINS XTAL1 AND XTAL2) (VDD = 3.3V, VDDP = 5V, fXTAL = 10MHz,

unless otherwise noted. Typical values are to Ta = 25°C)

Symbol

Parameter

CXTAL1,2 External capacitance on

pins XTAIL1, XTAIL2

fXTAL Crystal Frequency

fXTAL1 Frequency applied on pin

XTAL1

VIH High level input voltage on

pin XTAIL1

VIL Low level input voltage on

pin XTAIL1

Test Conditions

Depends on type of crystal or resonator

used

Min.

Typ.

Max.

15

Unit

pF

2

26 MHz

0

26 MHz

0.7 VDD

-0.3

VDD+0.3 V

+0.3VDD V

Table 9: Data Lines (PINS I/O, I/OUC, AUX1, AUX2, AUX1UC AND AUX2UC) (VDD = 3.3V, VDDP = 5V,

fXTAL = 10MHz, unless otherwise noted. Typical values are to Ta = 25°C)

Symbol

Parameter

tD(I/O-I/OUC), I/O to I/OUC, I/OUC to I/O

tD(I/OUC-I/O) falling edge delay

tpu

Active pull-up pulse width

fI/O(MAX) Maximum frequency on

data lines

CI

Input capacitance on data

lines

Test Conditions

Min.

Typ.

Max. Unit

200 ns

100 ns

1

MHz

10

pF

6/23

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