WM2626 Просмотр технического описания (PDF) - Wolfson Microelectronics plc

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производитель

WM2626

Low Power Dual 8-bit Serial Input DAC with Internal Reference

Wolfson Microelectronics plc 

Production Data

SERIAL INTERFACE

SCLK

DIN

NCS

1

tSUD

tHD

D15

tSUCSCK

tWL

tWH

2

3

D14

D13

Figure 1 Timing Diagram

WM2626

tSUC16CS

4

5 15

16

D12

D1

D0

Test Conditions:

RL = 10kΩ, CL = 100pF. VDD = 5V ± 10%, VREF = 2.048V and VDD = 3V ± 10%, VREF = 1.024V over recommended operating

free-air temperature range (unless noted otherwise).

SYMBOL TEST CONDITIONS

MIN

tSUCSCK

Setup time, NCS low before first falling SCLK edge

10

Setup time, 16th falling SCLK edge (when data bit D0

tSUC16CS

is sampled) before NCS rising edge.

10

tWH

Pulse duration, SCLK high.

25

tWL

Pulse duration, SCLK low.

25

tSUD

Setup time, data ready before SCLK falling edge.

10

tHD

Hold time, data held valid after SCLK falling edge.

5

TYP

MAX

UNIT

ns

ns

ns

ns

ns

ns

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 April 2001

5

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