74HCT4511D Просмотр технического описания (PDF) - NXP Semiconductors.
Номер в каталоге
Компоненты Описание
производитель
74HCT4511D Datasheet PDF : 18 Pages
| |||
Nexperia
74HC4511; 74HCT4511
BCD to 7-segment latch/decoder/driver
9,
W:
QHJDWLYH
SXOVH
90
9
WI
9,
SRVLWLYH
SXOVH
WU
90
9
W:
90
WU
WI
90
9,
*
9&&
92
'87
57
9&&
5/ 6
&/
RSHQ
DDG
Test data is given in Table 9.
Test circuit definitions:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator
CL = Load capacitance including jig and probe capacitance
RL = Load resistance.
S1 = Test selection switch
Fig 12. Test circuit for measuring switching times
Table 9. Test data
Type
Input
VI
tr, tf
74HC4511
VCC
6 ns
74HCT4511
3V
6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
74HC_HCT4511
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 15 November 2016
© Nexperia B.V. 2017. All rights reserved
12 of 18
Share Link: 